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X-ray diffraction and Raman scattering studies in10B+-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation

✍ Scribed by M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; Hee Chul Lee

Book ID
110413335
Publisher
Springer US
Year
2003
Tongue
English
Weight
438 KB
Volume
14
Category
Article
ISSN
0957-4522

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✍ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 376 KB πŸ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a