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XPS and X-ray diffraction characterization of MoO3 thin films prepared by laser evaporation

✍ Scribed by J. Torres; J. E. Alfonso; L. D. López-Carreño

Book ID
104557651
Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
90 KB
Volume
2
Category
Article
ISSN
1862-6351

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## Thin (x = 0-30 at.% ) alloy Ðlms prepared by a reactive radio frequency (r.f.) sputtering (Co 0.8 Al 0.2 ) 100-x N x method were characterized by XPS and x-ray di †raction (XRD). The Ðlm with no nitrogen consisted of a CsCltype CoAl metallic compound, while the nitrogen-containing alloys were c