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Spectroscopic ellipsometry and Raman study of fluorinated nanocrystalline carbon thin films

✍ Scribed by Lee, Hosun; Kim, In-Young; Han, S.-S.; Bae, B.-S.; Choi, M. K.; Yang, In-Sang

Book ID: 120382251
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 358 KB
Volume: 90
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1378337

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