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Spectroscopic ellipsometry investigations of the optical constants of nanocrystalline SnS thin films

✍ Scribed by Shaaban, E R; Abd El-Sadek, M S; El-Hagary, M; Yahia, I S


Book ID
119995392
Publisher
Royal Swedish Academy of Sciences
Year
2012
Tongue
English
Weight
557 KB
Volume
86
Category
Article
ISSN
0031-8949

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Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x