𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of optical constants of pentacene thin film by spectroscopic ellipsometry

✍ Scribed by Debjit Datta; Satyendra Kumar


Book ID
108265578
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
336 KB
Volume
94
Category
Article
ISSN
0927-0248

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x

Optical Characterization of Silicon Oxyn
✍ Yi-Ming Xiong; Paul G. Snyder; John A. Woollam; G. A. Al-Jumaily; F. J. Gagliard πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 424 KB

## Abstract Silicon oxynitride (SiO~x~ N~y~) thin films were deposited on silicon substrates by ion‐assisted deposition. Variable angle spectroscopic ellipsometry (VASE) was used to optically characterize the deposited film properties, such as layer thickness and composition, film surface and inter