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Soft breakdown of ultra-thin gate oxide layers

✍ Scribed by Depas, M.; Nigam, T.; Heyns, M.M.

Book ID: 114536582
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 711 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.535341

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