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SiSiO2 interface states based on optically activated conductance technique

✍ Scribed by R.J. Singh; R.S. Srivastava

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 404 KB
Volume: 26
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(83)90130-2

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