✦ LIBER ✦
The Si-SiO2 interface—Electrical properties as determined by the metal-insulator-silicon-conductance technique : E. H. Nicollian and A. Goetzberger, Bell Syst. Tech. J.46, No. 6, July–August (1967), p. 1055
- Publisher
- Elsevier Science
- Year
- 1968
- Tongue
- English
- Weight
- 95 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0026-2714
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