Interface states in MOS structures with 20–40 Å thick SiO2 films on nondegenerate Si : S. Kar and W. E. Dahlke, Solid St. Electron. 15 (1972), p. 221

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 214 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90516-1