✦ LIBER ✦

Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops

✍ Scribed by Uznanski, Slawosz; Gasiot, Gilles; Roche, Philippe; Tavernier, Clement; Autran, Jean-Luc

No coin nor oath required. For personal study only.

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