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Alpha-Induced Multiple Cell Upsets in Standard and Radiation Hardened SRAMs Manufactured in a 65 nm CMOS Technology

โœ Scribed by Gasiot, G.; Giot, D.; Roche, P.

Book ID
120082522
Publisher
IEEE
Year
2006
Tongue
English
Weight
1014 KB
Volume
53
Category
Article
ISSN
0018-9499

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