[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

✍ Scribed by Roche, Philippe; Lysinger, Mark; Gasiot, Gilles; Daveau, Jean-Marc; Zamanian, Mehdi; Dautriche, Pierre

• Book ID: 126688416
• Publisher: IEEE
• Year: 2008
• Weight: 237 KB
• Category: Article
• ISBN: 0769532640
• DOI: 10.1109/IOLTS.2008.60