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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies

✍ Scribed by Huang, Zhengfeng; Liang, Huaguo

Book ID: 120306205
Publisher: IEEE
Year: 2008
Weight: 326 KB
Category: Article
ISBN: 0769532640
DOI: 10.1109/IOLTS.2008.9

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