𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - SRAM Cell Design Protected from SEU Upsets

✍ Scribed by Shiyanovskii, Yuriy; Wolff, Francis; Papachristou, Chris

Book ID: 120306204
Publisher: IEEE
Year: 2008
Weight: 232 KB
Category: Article
ISBN: 0769532640
DOI: 10.1109/IOLTS.2008.49

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Propagation of Transients Along Sensitizable Paths

✍ Gangadhar, Sreenivas; Skoufis, Michael; Tragoudas, Spyros 📂 Article 📅 2008 🏛 IEEE ⚖ 210 KB

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Developing Fault Injection Environment for Complex Experiments

✍ Gawkowski, P.; Sosnowski, J. 📂 Article 📅 2008 🏛 IEEE ⚖ 238 KB

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Special Session 4: Reliability and Circuit Simulation

✍ Aitken, Rob 📂 Article 📅 2008 🏛 IEEE ⚖ 142 KB

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Totally Fault Tolerant RNS Based FIR Filters

✍ Pontarelli, S.; Cardarilli, G.C.; Re, M.; Salsano, A. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 357 KB

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Fault Tolerant Reversible Finite Field Arithmetic Circuits

✍ Mathew, Jimson; Singh, Jawar; Taleb, Anas Abu; Pradhan, Dhiraj K. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 179 KB

[IEEE 2008 14th IEEE International On-Li

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Reliability in Application Specific Mesh-Based NoC Architectures

✍ Refan, Fatemeh; Alemzadeh, Homa; Safari, Saeed; Prinetto, Paolo; Navabi, Zainala 📂 Article 📅 2008 🏛 IEEE ⚖ 629 KB