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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Fault Tolerant Reversible Finite Field Arithmetic Circuits

✍ Scribed by Mathew, Jimson; Singh, Jawar; Taleb, Anas Abu; Pradhan, Dhiraj K.

Book ID: 127114608
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 179 KB
Category: Article
ISBN: 0769532640
DOI: 10.1109/iolts.2008.35

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