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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A Modular Memory BIST for Optimized Memory Repair

✍ Scribed by Oehler, Philipp; Bosio, Alberto; Natale, Giorgio di; Hellebrand, Sybille

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