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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node

✍ Scribed by Leroy, Damien; Gaillard, Rémi; Schaefer, Erwin; Beltrando, Cyrille; Wen, Shi-Jie; Wong, Richard

No coin nor oath required. For personal study only.

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