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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Integrating Scan Design and Soft Error Correction in Low-Power Applications

✍ Scribed by Imhof, Michael E.; Wunderlich, Hans-Joachim; Zoellin, Christian G.

No coin nor oath required. For personal study only.

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