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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

✍ Scribed by Martinie, S.; Autran, J.L.; Sauze, S.; Munteanu, D.; Uznanski, S.; Roche, P.; Gasiot, G.

Book ID: 126653938
Publisher: IEEE
Year: 2011
Weight: 694 KB
Category: Article
ISBN: 1457705850
DOI: 10.1109/RADECS.2011.6131359

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