[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS

✍ Scribed by Gaspard, N.; Jagannathan, S.; Diggins, Z.; McCurdy, M.; Loveless, T. D.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.; Oates, T. S.; Fang, Y.-P; Wen, S.-J; Wong, R.; Lilja, K.; Bounasser, M.

• Book ID: 120974261
• Publisher: IEEE
• Year: 2013
• Weight: 546 KB
• Category: Article
• ISBN: 1479901113
• DOI: 10.1109/IRPS.2013.6532113