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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Estimating the frequency threshold for logic soft errors

✍ Scribed by Mahatme, N. N.; Gaspard, N. J.; Jagannathan, S.; Loveless, T. D.; Abdel-Aziz, H.; Bhuva, B. L.; Massengill, L. W.; Wen, S.; Wong, R.

Book ID: 120974260
Publisher: IEEE
Year: 2013
Weight: 166 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6531991

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