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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - An age-aware library for reliability simulation of digital ICs

✍ Scribed by Katoozi, M.; Cannon, E. H.; Tuan Dao, ; Aitken, K.; Fischer, S.; Amort, T.; Brees, R.; Tostenrude, J.

Book ID: 124084071
Publisher: IEEE
Year: 2013
Weight: 578 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6531973

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