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Single Event Effects in 90-nm Phase Change Memories

โœ Scribed by Gerardin, S.; Bagatin, M.; Paccagnella, A.; Visconti, A.; Bonanomi, M.; Pellizzer, F.; Vela, M.; Ferlet-Cavrois, V.


Book ID
115538080
Publisher
IEEE
Year
2011
Tongue
English
Weight
489 KB
Volume
58
Category
Article
ISSN
0018-9499

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