A new atomic scale model has been developed to simulate anisotropic etching of silicon in KOH solutions. This model is based on the influence of the number of hydroxide groups attached to atoms. Etch rates and macroscopic activation energies have been calculated and compared with experimental data.
Simulation of silicon etching with KOH
โ Scribed by H. Camon; Z. Moktadir
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 601 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2692
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โฆ Synopsis
Anisotropic chemical etching of monocrystalline silicon in KOH aqueous solution is investigated. The atomic scale model proposed is based on the influence of the OH group on chemical bonds. Etch rate and activation energies are calculated and extended to the complete etch rate polar diagram and compared to available experimental data. Finally, an analytical description of etch rate ratios is proposed.
๐ SIMILAR VOLUMES
The polarization curves of p-type and n-type silicon in aqueous KOH were studied. It is indicated that both p-Si and n-Si exhibit active-passive transpassive behaviour. The difference in polarization curve between these two types of Si is attributed to the carriers' transport limitation. In the p-Si
## High -index silicon planes have been etched with KOH of concentrations ranging from 2 mol/l to 12 mol/l (lo-46 wt.%) at temperatures between 50 "C and 95 "C, using two kinds of samples. We have etched mechanically prepared {n 11) and {nnl) (n = 2, 3, 4) crystal planes which we obtained by bevel