✦ LIBER ✦

SIMS depth profiling of vertical p-channel Si-MOS transistor structures

✍ Scribed by U. Zastrow; R. Loo; K. Szot; J. Moers; T. Grabolla; D. Behammer; L. Vescan

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analytical modeling of threshold voltage

✍ K. Iniewski; S. Voinigescu; J. Atcha; C.A.T. Salama 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 854 KB

Extraction of lateral device parameters

✍ Jongoh Kim; Byounguk Ihn; Bumman Kim; Kwangil Lee; Wonoh Lee; Seounghwan Lee 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 395 KB

A new method for the determination of ch

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 254 KB

Threshold shift of p-channel transistors

✍ R.C.Y. Fang 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 547 KB

Bias temperature instability assessment

✍ Werner Muth; Wolfgang Walter 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 499 KB

Secondary ion mass spectrometry depth pr

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 147 KB