✦ LIBER ✦
A new method for the determination of channel depth and doping profile in buried-channel MOS transistors : K. Iniewski and A. Jakubowski. Solid-St. Electron. 31, 1259 (1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 254 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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