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Analytical modeling of threshold voltages in p-channel Si/SiGe/Si MOS structures

โœ Scribed by K. Iniewski; S. Voinigescu; J. Atcha; C.A.T. Salama


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
854 KB
Volume
36
Category
Article
ISSN
0038-1101

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