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Signature of the gallium-oxygen-gallium defect in GaAs by deep level transient spectroscopy measurements

✍ Scribed by Neild, S. T.; Skowronski, M.; Lagowski, J.

Book ID: 121392085
Publisher: American Institute of Physics
Year: 1991
Tongue: English
Weight: 556 KB
Volume: 58
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.104513

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