Depth progression of dissociation reaction of the 1.014-eV photoluminescence copper center in copper-diffused silicon crystal measured by deep-level transient spectroscopy

✍ Scribed by Nakamura, Minoru; Murakami, Susumu

• Book ID: 120185671
• Publisher: American Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 317 KB
• Volume: 98
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3575574