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A study of the dependence of electron-induced defects on the doping impurity density in n-type germanium by deep-level transient spectroscopy (DLTS)

✍ Scribed by Cloud Nyamhere; F.D. Auret; A.G.M. Das; A. Chawanda


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
167 KB
Volume
401-402
Category
Article
ISSN
0921-4526

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