Root Cause of Charge Loss in a Nitride-Based Localized Trapping Memory Cell

✍ Scribed by Furnemont, A.; Rosmeulen, M.; van der Zanden, K.; Van Houdt, J.; De Meyer, K.; Maes, H.

• Book ID: 114618722
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 640 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.895238