๐”– Bobbio Scriptorium
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Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique

โœ Scribed by Shaw-Hung Gu; Tahui Wang; Wen-Pin Lu; Wenchi Ting; Ku, Y.-H.J.; Chih-Yuan Lu


Book ID
114618053
Publisher
IEEE
Year
2006
Tongue
English
Weight
499 KB
Volume
53
Category
Article
ISSN
0018-9383

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