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Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell

✍ Scribed by Wen-Jer Tsai; Chih-Chieh Yeh; Nian-Kai Zous; Chen-Chin Liu; Shih-Keng Cho; Tahui Wang; Pan, S.C.; Chih-Yuan Lu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Investigation of STI edge effect on prog

✍ Yue Xu; Feng Yan; ZhiGuo Li; Fan Yang; Jianguang Chang; YongGang Wang 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 813 KB

A novel operation method to avoid over-e

✍ Wen-Jer Tsai; Nian-Kai Zous; Tahui Wang; Ku, Y.-H.J.; Chih-Yuan Lu 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 292 KB

A new method to extract gate coupling ra

✍ Jermyn M.Z. Tseng; Thierry Pedron 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 158 KB