A new method to extract gate coupling ratio and oxide trapped charge in flash memory cell

✍ Scribed by Jermyn M.Z. Tseng; Thierry Pedron

• Book ID: 108207518
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 158 KB
• Volume: 83
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2005.08.002