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RF measurements and characterization of heterostructure field-effect transistors at low temperatures

✍ Scribed by Brockerhoff, W.; Meschede, H.; Prost, W.; Heime, K.; Weimann, G.; Schlapp, W.

Book ID: 114551982
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 812 KB
Volume: 37
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.32221

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