d.c.- and r.f.-characterisation of conventional and superlattice heterostructure field-effect transistors at low temeperatures

✍ Scribed by W. Brockerhoff; W. Prost; H. Meschede; J. Kraus; K. Heime; G. Weimann; W. Schlapp

• Book ID: 103392383
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 737 KB
• Volume: 33
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(90)90114-t