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RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

✍ Scribed by Schmitz, J.; Cubaynes, F.N.; Havens, R.J.; de Kort, R.; Scholten, A.J.; Tiemeijer, L.F.

Book ID: 120440686
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 259 KB
Volume: 24
Category: Article
ISSN: 0741-3106
DOI: 10.1109/LED.2002.807016

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