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Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques

✍ Scribed by Erdem Atar; Cevat Sarioglu; Ugur Demirler; E Sabri Kayali; Huseyin Cimenoglu


Book ID
114387347
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
122 KB
Volume
48
Category
Article
ISSN
1359-6462

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