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Determination of thickness of multiple layer thin films by an x‐ray‐diffraction technique

✍ Scribed by Chaudhuri, J.; Hashmi, F.

Book ID: 118033165
Publisher: American Institute of Physics
Year: 1994
Tongue: English
Weight: 544 KB
Volume: 76
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.357275

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