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Structure determination of thin CoFe films by anomalous x-ray diffraction

✍ Scribed by Gloskovskii, Andrei; Stryganyuk, Gregory; Ouardi, Siham; Fecher, Gerhard H.; Felser, Claudia; Hamrle, Jaroslav; Pištora, Jaromír; Bosu, Subrojati; Saito, Kesami; Sakuraba, Yuya; Takanashi, Koki

Book ID: 115493390
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 447 KB
Volume: 112
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.4755801

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