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X-ray diffraction by multilayered thin film structures and their diffusion

Publisher
Elsevier Science
Year
1968
Tongue
English
Weight
159 KB
Volume
18
Category
Article
ISSN
0042-207X

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๐Ÿ“œ SIMILAR VOLUMES

Thin Film Analysis by X-Ray Scattering (
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โœ Birkholz, Mario ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr

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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t