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Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication

✍ Scribed by X. G. Zhang; P. Li; D. W. Parent; G. Zhao; J. E. Ayers; F. C. Jain

Book ID: 107457916
Publisher: Springer US
Year: 1999
Tongue: English
Weight: 107 KB
Volume: 28
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-999-0111-1

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