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Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction

✍ Scribed by C.-H. Ma; J.-H. Huang; Haydn Chen

Book ID: 108388480
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 139 KB
Volume: 418
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(02)00680-6

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