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Depth profiling of thin ITO films by grazing incidence X-ray diffraction

✍ Scribed by D.G. Neerinck; T.J. Vink

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 726 KB
Volume: 278
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(95)08117-8

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