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Thin-film characterization by grazing incidence X-ray diffraction and multiple beam interference

✍ Scribed by S.-L. Chang

Book ID: 108356528
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 426 KB
Volume: 62
Category: Article
ISSN: 0022-3697
DOI: 10.1016/s0022-3697(01)00109-3

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