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Removal of redundancy in combinational circuits under classification of undetectable faults

✍ Scribed by Seiji Kajihara; Kozo Kinoshita; Haruko Shiba

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
723 KB
Volume
24
Category
Article
ISSN
0882-1666

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✦ Synopsis

Abstract

This paper proposes a method for efficiently removing redundant elements using properties of undetectable faults obtained by test pattern generation. Lines of redundant elements have undetectable single stuck‐at faults. We classify undetectable faults into three categories according to the test pattern generation process, and then assume that some redundant elements can be removed concurrently. Our method produces a nonredundant circuit efficiently by using these properties and generates test patterns with high fault coverage. Some experimental results for ISCAS '85 benchmark circuits are also shown.

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