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Redistribution of implanted impurities in dual As+ and B+ implanted silicon during annealing

โœ Scribed by Katsuhiro Yokota; Takafumi Nakamura; Takaei Kitagawa; Fumiyoshi Miyashita; Kiyoto Hirai; Hiromichi Takano; Masao Kumagai


Book ID
114168733
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
377 KB
Volume
127-128
Category
Article
ISSN
0168-583X

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