✦ LIBER ✦

Qualitative study of beta silicon carbide residual stress by Raman spectroscopy

✍ Scribed by Y.M Lu; I.C Leu

Book ID: 114085269
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 551 KB
Volume: 377-378
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(00)01313-4

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Silicon Carbide (Volume 1: Growth, Defec

Silicon Carbide (Volume 1: Growth, Defects, and Novel Applications) || Characterization of Defects in Silicon Carbide by Raman Spectroscopy

✍ Friedrichs, Peter; Kimoto, Tsunenobu; Ley, Lothar; Pensl, Gerhard 📂 Article 📅 2011 🏛 Wiley-VCH Verlag GmbH & Co. KGaA ⚖ 766 KB

An application of Raman spectroscopy on

An application of Raman spectroscopy on the measurement of residual stress in porous silicon

✍ Yilan Kang; Yu Qiu; Zhenkun Lei; Ming Hu 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 336 KB

Determination of Stress in Porous Silico

Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy

✍ Manotas, S. ;Agull�-Rueda, F. ;Moreno, J.D. ;Ben-Hander, F. ;Guerrero-Lemus, R. 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 83 KB 👁 2 views

Raman microspectroscopy study of process

Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon

✍ Gogotsi, Y; Baek, C; Kirscht, F 📂 Article 📅 1999 🏛 Institute of Physics 🌐 English ⚖ 847 KB

Variations of the silicon network of amo

Variations of the silicon network of amorphous silicon studied by Raman spectroscopy

✍ Y. Hishikawa; K. Watanabe; S. Tsuda; S. Nakano; M. Ohnishi; Y. Kuwano 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 153 KB

Raman Microprobe Study on Relaxation of

Raman Microprobe Study on Relaxation of Residual Stresses in Patterned Silicon-on-Sapphire

✍ Yamazaki, Ken-ichi; Uotani, Ricardo Katsumi; Nambu, Katsumi; Yamada, Masayoshi; 📂 Article 📅 1984 🏛 Institute of Pure and Applied Physics 🌐 English ⚖ 389 KB