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Silicon Carbide (Volume 1: Growth, Defects, and Novel Applications) || Characterization of Defects in Silicon Carbide by Raman Spectroscopy

✍ Scribed by Friedrichs, Peter; Kimoto, Tsunenobu; Ley, Lothar; Pensl, Gerhard

Book ID: 121327978
Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
Year: 2011
Weight: 766 KB
Category: Article
ISBN: 352740953X
DOI: 10.1002/9783527629053.ch9

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