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Electron Microscopy of Dislocations and Other Defects in Sapphire and in Silicon Carbide, Thinned by Sputtering

✍ Scribed by C. M. Drum

Publisher: John Wiley and Sons
Year: 1965
Tongue: English
Weight: 522 KB
Volume: 9
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19650090233

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